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Added multi testing for digital pins (via array) #3
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I had a couple of complains:
What i've done:
While reviewing I noticed three other things:
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Yes, at least in the library itself. Im going to adjust the winder version as soon as the change is in main.
Just press Ctrl+Alt+F (also documented in the Editor Settings section in the coding conventions)
At some point we have to merge changes in the main branch so just open a pull request and assign me as a reviewer once you finished working on a issue or implemented a new feature.
I don't think the map function provides any advantages in terms of code readability or code length here. So I would stick with a simple for loop.
That's true. But I don't believe that there is an option to get a permalink to a single chapter anyway. And once a pull request or issue is closed the references don't really matte either. You can add your concerns in a comment on https://github.com/QiTech-Industries/Wiki/issues/2 |
@happybrick |
This Pull Request implements validation of multiple pins as requested in #1 . Thus making it simpler to validate more than one pin.
In addition to
bool isDigitalPinValid(uint8_t pin);
a functionbool isDigitalPinsValid(uint8_t pins[], uint16_t pinsLength);
is now available.