Test in Wokwi #230
Artifacts
Produced during runtime
Name | Size | |
---|---|---|
test-adc-results
|
5.43 KB |
|
test-crypto-results
|
6.08 KB |
|
test-efuse-results
|
101 KB |
|
test-gpio-results
|
32.5 KB |
|
test-gptimer-results
|
6.38 KB |
|
test-hello-world-latest-results
|
5.48 KB |
|
test-hello-world-release-v4.4-results
|
4.31 KB |
|
test-hello-world-release-v5.0-results
|
4.23 KB |
|
test-hello-world-release-v5.1-results
|
4.93 KB |
|
test-hello-world-release-v5.2-results
|
5.14 KB |
|
test-hello-world-release-v5.3-results
|
5.5 KB |
|
test-i2c-results
|
8.61 KB |
|
test-nvs_flash-results
|
4.88 KB |
|
test-pcnt-results
|
7.83 KB |
|
test-psram-results
|
5.1 KB |
|
test-spi_master-results
|
102 KB |
|
test-timer-results
|
3.79 KB |
|
test-uart-results
|
7.22 KB |
|
test-usb_serial_jtag-results
|
62.9 KB |
|
test-wifi_function-results
|
12.9 KB |
|