fix tests

Signed-off-by: Adrian Gielniewski <[email protected]>
nrfconnect · Feb 25, 2025 · 9f0f05a · 9f0f05a
1 parent ee2397a
commit 9f0f05a
Showing 1 changed file with 7 additions and 0 deletions.
diff --git a/src/app/tests/TestFailSafeContext.cpp b/src/app/tests/TestFailSafeContext.cpp
@@ -34,6 +34,7 @@
 #include <lib/core/StringBuilderAdapters.h>
 #include <lib/support/CHIPMem.h>
 #include <lib/support/CodeUtils.h>
+#include <lib/support/TestPersistentStorageDelegate.h>
 #include <platform/CHIPDeviceLayer.h>
 
 using namespace chip;
@@ -66,8 +67,11 @@ class TestFailSafeContext : public ::testing::Test
 
 TEST_F(TestFailSafeContext, TestFailSafeContext_ArmFailSafe)
 {
+    chip::TestPersistentStorageDelegate testStorage;
     chip::app::FailSafeContext failSafeContext;
 
+    failSafeContext.Init({ &testStorage });
+
     EXPECT_EQ(failSafeContext.ArmFailSafe(kTestAccessingFabricIndex1, System::Clock::Seconds16(1)), CHIP_NO_ERROR);
     EXPECT_TRUE(failSafeContext.IsFailSafeArmed());
     EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex1);
@@ -80,8 +84,11 @@ TEST_F(TestFailSafeContext, TestFailSafeContext_ArmFailSafe)
 
 TEST_F(TestFailSafeContext, TestFailSafeContext_NocCommandInvoked)
 {
+    chip::TestPersistentStorageDelegate testStorage;
     chip::app::FailSafeContext failSafeContext;
 
+    failSafeContext.Init({ &testStorage });
+
     EXPECT_EQ(failSafeContext.ArmFailSafe(kTestAccessingFabricIndex1, System::Clock::Seconds16(1)), CHIP_NO_ERROR);
     EXPECT_EQ(failSafeContext.GetFabricIndex(), kTestAccessingFabricIndex1);