DAOS-17045 bio: drain inflight health collecting on teardown

[NiuYawei]

When teardown a faulty device, ensure the inflight health collecting NVMe command completed before putting the io channel & open descriptor for health monitor.

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[github-actions]

Ticket title is 'server segfault on aurora with spdk'
Status is 'In Progress'
Labels: 'ALCF,alcf_track'
https://daosio.atlassian.net/browse/DAOS-17045

[wangshilong]

Do we need port this to 2.6 as well?

[tanabarr]

no unit tests for this area of code, is it considered safely covered by functional tests?

[NiuYawei]

Do we need port this to 2.6 as well?

Yes, I'll backport it for 2.6.4 once it's landed to master.

[NiuYawei]

no unit tests for this area of code, is it considered safely covered by functional tests?

yes, this defect can't be detected by unit test, since it's a race happened on server mode. I think we might already have some functional test which marks device as faulty? but that's not necessarily discover this race issue.

[daosbuild1]

Test stage Functional Hardware Large completed with status FAILURE. https://build.hpdd.intel.com//job/daos-stack/job/daos/view/change-requests/job/PR-15884/2/execution/node/1420/log