From 1fe237cfe3884964c2f55b88d72e281f03c587c7 Mon Sep 17 00:00:00 2001 From: Eric Hunsberger Date: Tue, 23 Oct 2018 08:47:31 -0700 Subject: [PATCH] Add a note about test_input_node failures Make it clear that this test only fails on the chip, only for some parameters, and only sometimes. --- nengo_loihi/tests/test_communication.py | 3 +++ 1 file changed, 3 insertions(+) diff --git a/nengo_loihi/tests/test_communication.py b/nengo_loihi/tests/test_communication.py index e224c0993..ff454427c 100644 --- a/nengo_loihi/tests/test_communication.py +++ b/nengo_loihi/tests/test_communication.py @@ -4,6 +4,9 @@ import pytest +# This test sometimes (but not consistently) fails on the chip for various +# combinations of the parameter values. This possibly has to do with +# interneuron noise and not representing the values well. @pytest.mark.xfail @pytest.mark.parametrize("val", (-0.75, -0.5, 0, 0.5, 0.75)) @pytest.mark.parametrize("type", ("array", "func"))