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description: Bremers, A., Parreira, M.T., Fang, X., Friedman, N., Ramirez-Aristizabal, A., Pabst, A., Spasojevic, M., Kuniavsky, M. and Ju, W., 2023. The Bystander Affect Detection (BAD) Dataset for Failure Detection in HRI. arXiv preprint arXiv:2303.04835.